Aims and Objectives

The aim of SAIF-AIIMS is to strive for excellence and ensure maximal utilization of the national resource.

The facility is committed to

• Provide assistance to research on electron microscopy by investigators,

• Provide expertise for the use of equipment, interpretation and evaluation of ultrastructural data,

• Develop new techniques in ultrastructural research to facilitate scientists working in the front-line areas of research and

• Organize regular training programs, workshops and symposia on Electron Microscopy for manpower development.

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